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ATS
2010
IEEE
13 years 3 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
ATS
2010
IEEE
13 years 15 days ago
2010
IEEE
In recent technology nodes, reliability is considered a part of the standard design flow at all levels of embedded system design. While techniques that use only low-level models at...
ENTCS
2006
13 years 5 months ago
2006
Model transformation tools implemented using graph transformation techniques are often expected to provide high performance. For this reason, in the Graph Rewriting and Transforma...
IJHPCA
2006
13 years 5 months ago
2006
pc.sagepub.com/cgi/content/abstract/20/2/233 The online version of this article can be found at: Published by: http://www.sagepublications.com can be found at:International Journal...
NOMS
2010
IEEE
13 years 3 months ago
2010
IEEE
—The online detection of anomalies is a vital element of operations in data centers and in utility clouds like Amazon EC2. Given ever-increasing data center sizes coupled with th...