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COLT
2010
Springer
13 years 3 months ago
2010
Springer
COLT
2010
Springer
13 years 3 months ago
2010
Springer
MICRO
2010
IEEE
13 years 2 months ago
2010
IEEE
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...
COLT
2010
Springer
13 years 3 months ago
2010
Springer
Let S be an arbitrary measurable space, T R and (X, Y ) be a random couple in S
COLT
2010
Springer
13 years 3 months ago
2010
Springer
Abstract. We pose the problem of determining the rate of convergence at which AdaBoost minimizes exponential loss. Boosting is the problem of combining many "weak," high-...