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DFT
2004
IEEE
13 years 9 months ago
2004
IEEE
Reliability and manufacturing costs due to defects is a significant problem with image sensors and the ability to recover from a fault would alleviate some of these costs. A fault...
DFT
2004
IEEE
13 years 9 months ago
2004
IEEE
Defect tolerance is an extremely important aspect in nano-scale electronics as the bottom-up selfassembly fabrication process results in a significantly higher defect density comp...
DFT
2004
IEEE
13 years 9 months ago
2004
IEEE
Quantum dot Cellular Automata (QCA) is amongst promising new computing scheme in the nano-scale regimes. As an emerging technology, QCA relies on radically different operations in...
DFT
2004
IEEE
13 years 9 months ago
2004
IEEE
In this paper, a simple codec algorithm based on Reed-Solomon (RS) codes is proposed for erasure correcting in RAID (Redundant Array of Independent Disks) level 6 systems. Unlike ...
ICIP
2004
IEEE
14 years 7 months ago
2004
IEEE
In this contribution we present an algorithm for spatial error concealment of lost image data caused by transmission of images in error prone environments. The surrounding correct...