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DSD
2007
IEEE
132views Hardware» more  DSD 2007»
13 years 8 months ago
On-Chip Cache Device Scaling Limits and Effective Fault Repair Techniques in Future Nanoscale Technology
In this study, we investigate different cache fault tolerance techniques to determine which will be most effective when on-chip memory cell defect probabilities exceed those of cu...
David Roberts, Nam Sung Kim, Trevor N. Mudge
DSD
2007
IEEE
160views Hardware» more  DSD 2007»
13 years 11 months ago
Alternatives in Designing Level-Restoring Buffers for Interconnection Networks in Field-Programmable Gate Arrays
Programmable routing and logic in field-programmable gate arrays are implemented using nMOS pass transistors. Since the threshold voltage drop across an nMOS device degrades the ...
Scott Miller, Mihai Sima, Michael McGuire