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GLVLSI
2008
IEEE
140views VLSI» more  GLVLSI 2008»
13 years 6 months ago
Guided test generation for isolation and detection of embedded trojans in ics
Mainak Banga, Maheshwar Chandrasekar, Lei Fang, Mi...
GLVLSI
2008
IEEE
121views VLSI» more  GLVLSI 2008»
13 years 11 months ago
FEKIS: a fast architecture-level thermal analyzer for online thermal regulation
Pu Liu, Sheldon X.-D. Tan, Wei Wu, Murli Tirumala
GLVLSI
2008
IEEE
105views VLSI» more  GLVLSI 2008»
13 years 6 months ago
A process and supply variation tolerant nano-CMOS low voltage, high speed, a/d converter for system-on-chip
This paper presents a process variation tolerant, SoC ready, 1GS/s, 6 bit flash analog-to-digital converter (ADC) suitable for integration into nanoscale digital CMOS technologie...
Dhruva Ghai, Saraju P. Mohanty, Elias Kougianos
GLVLSI
2008
IEEE
157views VLSI» more  GLVLSI 2008»
13 years 11 months ago
Coverage-driven automatic test generation for uml activity diagrams
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
Mingsong Chen, Prabhat Mishra, Dhrubajyoti Kalita
GLVLSI
2008
IEEE
128views VLSI» more  GLVLSI 2008»
13 years 11 months ago
NBTI-aware flip-flop characterization and design
With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...
Hamed Abrishami, Safar Hatami, Behnam Amelifard, M...