19 search results - page 4 / 4 » iTETRIS: Adaptation of ITS Technologies for Large Scale Inte... |
ASPDAC
2011
ACM
12 years 8 months ago
2011
ACM
- In low temperature polycrystalline silicon (LTPS) based display technologies, the electrical parameter variations in thin film transistors (TFTs) caused by random grain boundarie...
HPCA
2011
IEEE
12 years 8 months ago
2011
IEEE
Extreme technology integration in the sub-micron regime comes with a rapid rise in heat dissipation and power density for modern processors. Dynamic voltage scaling is a widely us...
ICC
2007
IEEE
13 years 11 months ago
2007
IEEE
— Optimal bandwidth utilisation together with resilience and recovery from failure are two key drivers for Traffic Engineering (TE) which have been widely addressed by the IP co...
ISPASS
2007
IEEE
13 years 11 months ago
2007
IEEE
Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...