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DAC
2004
ACM
14 years 5 months ago
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
Chong Zhao, Xiaoliang Bai, Sujit Dey
ICCAD
2004
IEEE
128views Hardware» more  ICCAD 2004»
14 years 1 months ago
Power estimation for cycle-accurate functional descriptions of hardware
— Cycle-accurate functional descriptions (CAFDs) are being widely adopted in integrated circuit (IC) design flows. Power estimation can potentially benefit from the inherent in...
Lin Zhong, Srivaths Ravi, Anand Raghunathan, Niraj...
ISPD
2004
ACM
134views Hardware» more  ISPD 2004»
13 years 10 months ago
Performance-driven register insertion in placement
As the CMOS technology is scaled into the dimension of nanometer, the clock frequencies and die sizes of ICs are shown to be increasing steadily [5]. Today, global wires that requ...
Dennis K. Y. Tong, Evangeline F. Y. Young
GI
2004
Springer
13 years 10 months ago
Towards a Framework and a Design Methodology for Autonomic Integrated Systems
: The transition from microelectronics to nanoelectronics reaches physical limits and results in a paradigm shift in the design and fabrication of electronic circuits. The conserva...
Andreas Herkersdorf, Wolfgang Rosenstiel
WSC
2004
13 years 6 months ago
"One" a New Tool for Supply Chain Network Optimization and Simulation
Nowadays, in a hotly competitive environment, companies are continuously trying to provide products and/or services to customers faster, cheaper, and better than the competitors d...
Hongwei Ding, Lyès Benyoucef, Xiaolan Xie, ...