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ICCAD
1991
IEEE
13 years 8 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
ICCAD
1991
IEEE
13 years 8 months ago
1991
IEEE
In a high level synthesis environment there is a strong need for flexible module generators. For the generation of regular structures efficient dedicated module generators can be ...
ICCAD
1991
IEEE
13 years 8 months ago
1991
IEEE
As feature sizes decrease and chip sizes increase, the area and performance of chips become dominated by the interconnect. In spite of this trend, most existing synthesis systems ...