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ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
Wireless sensor networks hold the potential to open new domains to distributed data acquisition. However, such networks are prone to premature failure because some nodes deplete t...
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
We present a rigorous framework that defines a class of net weighting schemes in which unconstrained minimization is successively performed on a weighted objective. We show that, ...
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
We propose a layout-driven test-architecture design and optimization technique for core-based system-on-chips (SoCs) that are fabricated using three-dimensional (3D) integration. ...
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...