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ICCD
2004
IEEE
14 years 2 months ago
2004
IEEE
Redundant rows and columns have been used for years to improve the yield of DRAM fabrication. However, finding a memory repair solution has been proved to be an NP-complete proble...
ICCD
2004
IEEE
14 years 2 months ago
2004
IEEE
Gate oxide tunneling current (Igate) is emerging as a key roadblock for device scaling in nanometer-scale CMOS circuits. A practical means to reduce Igate is to leverage dual Tox ...
ICCD
2004
IEEE
14 years 2 months ago
2004
IEEE
ACG (Adjacent Constraint Graph) is invented as a general floorplan representation. It has advantages of both adjacency graph and constraint graph of a floorplan: edges in an ACG...
ICCD
2004
IEEE
14 years 2 months ago
2004
IEEE
As frequencies and feature size scale faster than operating voltages, power density is increasing in each processor generation. Power density and the cost of removing the heat it ...
ICCD
2004
IEEE
14 years 2 months ago
2004
IEEE
— In this paper, we approach the gate sizing problem in VLSI circuits in the context of increasing variability of process and circuit parameters as technology scales into the nan...