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ISCA
1993
IEEE
112views Hardware» more  ISCA 1993»
13 years 9 months ago
Working Sets, Cache Sizes, and Node Granularity Issues for Large-Scale Multiprocessors
The distribution of resources among processors, memory and caches is a crucial question faced by designers of large-scale parallel machines. If a machine is to solve problems with...
Edward Rothberg, Jaswinder Pal Singh, Anoop Gupta
ISCA
1993
IEEE
117views Hardware» more  ISCA 1993»
13 years 9 months ago
Evaluation of Release Consistent Software Distributed Shared Memory on Emerging Network Technology
We evaluate the e ect of processor speed, network bandwidth, and software overhead on the performance of release-consistent software distributed shared memory. We examine ve di er...
Sandhya Dwarkadas, Peter J. Keleher, Alan L. Cox, ...
ITC
1993
IEEE
110views Hardware» more  ITC 1993»
13 years 9 months ago
Novel Test Pattern Generators for Pseudo-Exhaustive Testing
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...
Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A...
ITC
1993
IEEE
148views Hardware» more  ITC 1993»
13 years 9 months ago
DELTEST: Deterministic Test Generation for Gate-Delay Faults
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
Udo Mahlstedt
VLSID
1993
IEEE
136views VLSI» more  VLSID 1993»
13 years 9 months ago
A Simulation-Based Test Generation Scheme Using Genetic Algorithms
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
M. Srinivas, Lalit M. Patnaik