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ISQED
2007
IEEE
104views Hardware» more  ISQED 2007»
13 years 10 months ago
A DOE Set for Normalization-Based Extraction of Fill Impact on Capacitances
Andrew B. Kahng, Rasit Onur Topaloglu
ISQED
2007
IEEE
120views Hardware» more  ISQED 2007»
13 years 10 months ago
A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays
Nigel Drego, Anantha Chandrakasan, Duane S. Boning
ISQED
2007
IEEE
135views Hardware» more  ISQED 2007»
13 years 10 months ago
Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications
Amit Laknaur, Rui Xiao, Sai Raghuram Durbha, Haibo...
ISQED
2007
IEEE
109views Hardware» more  ISQED 2007»
13 years 10 months ago
Variation Impact on SER of Combinational Circuits
Krishnan Ramakrishnan, R. Rajaraman, S. Suresh, Na...