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ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
Large-scale process fluctuations (particularly random device mismatches) at nanoscale technologies bring about highdimensional strongly nonlinear performance variations that canno...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
– As silicon technology scales, we can integrate more and more circuits on a single chip, which means more I/Os are needed in modern designs. The flip-chip technology which was ...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
We propose a novel dependable SRAM with 7T memory cells, and introduce a new concept, “quality of a bit (QoB)” for it. The proposed SRAM has three modes: a typical mode, high-...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
Clock meshes have found increasingly wide applications in today’s high-performance IC designs. The inherent routing redundancies associated with clock meshes lead to improved cl...