Large-scale process fluctuations (particularly random device mismatches) at nanoscale technologies bring about highdimensional strongly nonlinear performance variations that canno...
– As silicon technology scales, we can integrate more and more circuits on a single chip, which means more I/Os are needed in modern designs. The flip-chip technology which was ...
We propose a novel dependable SRAM with 7T memory cells, and introduce a new concept, “quality of a bit (QoB)” for it. The proposed SRAM has three modes: a typical mode, high-...
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
Clock meshes have found increasingly wide applications in today’s high-performance IC designs. The inherent routing redundancies associated with clock meshes lead to improved cl...
Xiaoji Ye, Min Zhao, Rajendran Panda, Peng Li, Jia...