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ISQED
2010
IEEE
13 years 10 months ago
2010
IEEE
- In this paper, we propose a thermal-aware job allocation and scheduling algorithm for three-dimensional (3D) chip multiprocessor (CMP). The proposed algorithm assigns hot jobs to...
ISQED
2010
IEEE
14 years 6 days ago
2010
IEEE
—Negative Bias Temperature Instability (NBTI) is one of the major reliability problems in advanced technologies. NBTI causes threshold voltage degradation in a PMOS transistor wh...
ISQED
2010
IEEE
14 years 6 days ago
2010
IEEE
— Algorithms and tools used for IC implementation do not show deterministic and predictable behaviors with input parameter changes. Due to suboptimality and inaccuracy of underly...
ISQED
2010
IEEE
14 years 5 days ago
2010
IEEE
With the CMOS transistors being scaled to sub 45nm and lower, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging pr...
ISQED
2010
IEEE
14 years 6 days ago
2010
IEEE
Leakage power has grown significantly and is a major challenge in SoC design. Among SoC's components, clock distribution network power accounts for a large portion of chip po...