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11

ITC
2000
IEEE

93views Hardware» more ITC 2000»

Analysis of interconnect crosstalk defect coverage of test sets

13 years 9 months ago

Analysis of interconnect crosstalk defect coverage of test sets

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Yi Zhao, Sujit Dey

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11

ITC
2000
IEEE

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Analysis of failure sources in surface-micromachined MEMS

13 years 9 months ago

Analysis of failure sources in surface-micromachined MEMS

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Nilmoni Deb, Ronald D. Blanton

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13

ITC
2000
IEEE

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A domain coverage metric for the validation of behavioral VHDL descriptions

13 years 9 months ago

A domain coverage metric for the validation of behavioral VHDL descriptions

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Qiushuang Zhang, Ian G. Harris

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7

ITC
2000
IEEE

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Using on-chip test pattern compression for full scan SoC designs

13 years 9 months ago

Using on-chip test pattern compression for full scan SoC designs

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Helmut Lang, Jens Pfeiffer, Jeff Maguire

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11

ITC
2000
IEEE

62views Hardware» more ITC 2000»

Power conscious test synthesis and scheduling for BIST RTL data paths

13 years 8 months ago

Power conscious test synthesis and scheduling for BIST RTL data paths

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Nicola Nicolici, Bashir M. Al-Hashimi

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