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ITCS
2008
13 years 6 months ago
2008
ITCS
2008
13 years 6 months ago
2008
Even though geo data are getting more and more widely available nowadays, they often do not meet the requirements of location-based services concerning structure, content and forma...
CORR
2008
Springer
13 years 3 months ago
2008
Springer
The article presents a local search approach for the solution of timetabling problems in general, with a particular implementation for competition track 3 of the International Time...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
ICCD
2008
IEEE
14 years 2 months ago
2008
IEEE
— Test-access mechanisms (TAMs) and test wrappers (e.g., the IEEE Standard 1500 wrapper) facilitate the modular testing of embedded cores in a core-based system-on-chip (SOC). Su...