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MR
2007

127views Robotics» more MR 2007»

A comprehensive model for PMOS NBTI degradation: Recent progress

13 years 5 months ago

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Muhammad Ashraful Alam, Haldun Kufluoglu, D. Vargh...

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MR
2007

102views Robotics» more MR 2007»

Electrical measurements of voltage stressed Al2O3/GaAs MOSFET

13 years 5 months ago

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Z. Tang, P. D. Ye, D. Lee, C. R. Wie

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MR
2010

93views Robotics» more MR 2010»

Modeling of board-level package by Finite Element Analysis and laser interferometer measurements

13 years 4 months ago

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Bo Zhang, PinKuan Liu, Han Ding, Wenwu Cao

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MR
2006

71views Robotics» more MR 2006»

High-temperature reliability of Flip Chip assemblies

13 years 6 months ago

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T. Braun, K.-F. Becker, M. Koch, V. Bader, Rolf As...

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MR
2002

75views Robotics» more MR 2002»

DRAM reliability

13 years 5 months ago

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