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TCAD
2011
12 years 11 months ago
2011
Abstract—This work introduces GRIP, a global routing technique via integer programming. GRIP optimizes wirelength and via cost directly without going through a traditional layer ...
TCAD
2011
12 years 11 months ago
2011
—This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered launch-oncapture (LOC) scheme followed by the one-hot LOC scheme for testing ...
TCAD
2011
12 years 11 months ago
2011
—Escalating system-on-chip design complexity is the design community to raise the level of abstraction beyond register transfer level. Despite the unsuccessful adoptions of early...
TCAD
2011
12 years 11 months ago
2011
—Pre-bond testing of 3-D stacked integrated circuits (ICs) involves testing each individual die before bonding. The overall yield of 3-D ICs improves with pre-bond testability be...