12 search results - page 3 / 3 » vlsid 1997 |
VLSID
1997
IEEE
13 years 9 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
VLSID
2008
IEEE
13 years 11 months ago
2008
IEEE
It is well-known that varying architectural, technological and implementation aspects of embedded microprocessors, such as ARM, can produce widely differing performance and power ...