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    VLSID
    2009
    IEEE
    148views VLSI» more  VLSID 2009»
    DFX and Productivity
    14 years 5 months ago
    DFX and Productivity
    Download  vlsiconference.com
    Robert C. Aitken
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    VLSID
    2009
    IEEE
    141views VLSI» more  VLSID 2009»
    A Comparison of Approaches to Carrier Generation for Zigbee Transceivers
    14 years 5 months ago
    A Comparison of Approaches to Carrier Generation for Zigbee Transceivers
    Download  www.ee.iitm.ac.in
    Leburu Manojkumar, Arun Mohan, Nagendra Krishnapur...
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    VLSID
    2009
    IEEE
    110views VLSI» more  VLSID 2009»
    Security and Dependability of Embedded Systems: A Computer Architects' Perspective
    14 years 5 months ago
    Security and Dependability of Embedded Systems: A Computer Architects' Perspective
    Download  www.ce.pdn.ac.lk
    Jörg Henkel, Roshan G. Ragel, Sri Parameswara...
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    VLSID
    2009
    IEEE
    87views VLSI» more  VLSID 2009»
    Soft Error Rates with Inertial and Logical Masking
    14 years 5 months ago
    Soft Error Rates with Inertial and Logical Masking
    Download  www.eng.auburn.edu
    We analyze the neutron induced soft error rate (SER). An induced error pulse is modeled by two parameters, probability of occurrence and probability density function of the pulse ...
    Fan Wang, Vishwani D. Agrawal
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    VLSID
    2009
    IEEE
    150views VLSI» more  VLSID 2009»
    TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis
    14 years 5 months ago
    TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis
    Download  www.informatik.uni-freiburg.de
    We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
    Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis...
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