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12

VLSID
2009
IEEE

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Soft Error Rates with Inertial and Logical Masking

14 years 5 months ago

Soft Error Rates with Inertial and Logical Masking

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We analyze the neutron induced soft error rate (SER). An induced error pulse is modeled by two parameters, probability of occurrence and probability density function of the pulse width. We calculate failures in time (FIT) rates for ISCAS85 benchmark circuits. A comparison with measured SER for SRAMs shows better relevance of our work over other published work. Our CPU times are reasonable; bench

Fan Wang, Vishwani D. Agrawal

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Computer Aided Design | Error Pulse | Probability Density Function | Soft Error Rate | VLSID 2009 |

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Added	23 Nov 2009
Updated	23 Nov 2009
Type	Conference
Year	2009
Where	VLSID
Authors	Fan Wang, Vishwani D. Agrawal

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