Due to the inherent nature of heat flow in 3D integrated circuits, stacked dies exhibit a wide range of thermal characteristics. The strong dependence of leakage with temperature...
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
Network-on-Chip combined with Globally Asynchronous Locally Synchronous paradigm is a promising architecture for easy IP integration and utilization with multiple voltage levels. ...