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VTS
2000
IEEE
13 years 10 months ago
2000
IEEE
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
VTS
2000
IEEE
13 years 10 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
VTS
2000
IEEE
13 years 10 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
VTS
2000
IEEE
13 years 10 months ago
2000
IEEE
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructions. It is observed that a structurally testable path (i.e., a path testable thro...
VTS
2000
IEEE
13 years 10 months ago
2000
IEEE
A novel design-for-test (DFT) technique is presented for designing a core with a “virtual scan chain” which looks (to the system integrator) like it is shorter than the real s...