21 search results - page 4 / 5 » vts 2002 |
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
Run-length codes and their variants have recently been shown to be very effective for compressing system-on-achip (SOC) test data. In this paper, we analyze the Golomb code, the c...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
The testing time for a system-on-chip (SOC) is determined to a large extent by the design of test wrappers and the test access mechanism (TAM). Wrapper/TAM co-optimization is ther...
ICPR
2002
IEEE
14 years 6 months ago
2002
IEEE
The performance of face verification systems has steadily improved over the last few years, mainly focusing on models rather than on feature processing. State-of-the-art methods o...
BMVC
2002
13 years 7 months ago
2002
Statistical models of shape and appearance have been successfully used in face modeling, tracking and synthesis. In this paper we describe experiments using appearance models for ...