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VTS
2007
IEEE
102views Hardware» more  VTS 2007»
13 years 11 months ago
Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications
Byoungho Kim, Zhenhai Fu, Jacob A. Abraham
VTS
2007
IEEE
85views Hardware» more  VTS 2007»
13 years 11 months ago
Minimizing the Impact of Scan Compression
Peter Wohl, John A. Waicukauski, Rohit Kapur, S. R...
PRL
2007
148views more  PRL 2007»
13 years 4 months ago
Damascening video databases for evaluation of face tracking and recognition - The DXM2VTS database
Performance quantification of biometric systems, such as face tracking and recognition highly depend on the database used for testing the systems. Systems trained and tested on r...
Dereje Teferi, Josef Bigün
VTS
2007
IEEE
71views Hardware» more  VTS 2007»
13 years 11 months ago
Optimizing Test Length for Soft Faults in DRAM Devices
: Soft faults in DRAMs are faults that do not get sensitized directly after an operation is performed, but require a time to pass before the fault can be detected. Tests developed ...
Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev
VTS
2007
IEEE
114views Hardware» more  VTS 2007»
13 years 11 months ago
Parameter Estimation for a Model with Both Imperfect Test and Repair
We describe estimation of the parameters of a manufacturing test and repair model using data available from that test. The model allows imperfect testing and imperfect repair. The...
Simon P. Wilson, Ben Flood, Suresh Goyal, Jim Mosh...