Sciweavers

ITC
1998
IEEE
82views Hardware» more  ITC 1998»
14 years 1 months ago
A high speed and area efficient on-chip analog waveform extractor
ABSTRACT - A multiple pass A/D conversion technique is proposed for mixed-signal test applications. Only a single on-chip comparator and sample-and-hold circuit is required to digi...
Ara Hajjar, Gordon W. Roberts
ASPDAC
2004
ACM
71views Hardware» more  ASPDAC 2004»
14 years 2 months ago
Golay and wavelet error control codes in VLSI
– This paper presents a high speed VLSI implementation of wavelet and golay error control codes. The design has been fabricated by MOSIS in a TSMC 0.25 µm CMOS process. Experime...
Arunkumar Balasundaram, Angelo Pereira, Jun-Cheol ...
DATE
2005
IEEE
110views Hardware» more  DATE 2005»
14 years 3 months ago
Designer-Driven Topology Optimization for Pipelined Analog to Digital Converters
This paper suggests a practical “hybrid” synthesis methodology which integrates designer-derived analytical models for system-level description with simulation-based models at...
Yu-Tsun Chien, Dong Chen, Jea-Hong Lou, Gin-Kou Ma...
CAMP
2005
IEEE
14 years 3 months ago
Principles of a CMOS Sensor Dedicated to Face Tracking and Recognition
— This paper describes the main principles of a vision sensor dedicated to the detecting and tracking faces in video sequences. For this purpose, a current mode CMOS active senso...
Dominique Ginhac, Eri Prasetyo, Michel Paindavoine...
ISCAS
2006
IEEE
112views Hardware» more  ISCAS 2006»
14 years 3 months ago
A CMOS potentiostat for control of integrated MEMS actuators
— We describe a potentiostat designed for in situ electrochemical control of MEMS actuators. This module is tailored for integration into a hybrid CMOS-MEMS system-ona-chip to co...
S. B. Prakash, Pamela Abshire, M. Urdaneta, M. Chr...
DATE
2007
IEEE
55views Hardware» more  DATE 2007»
14 years 3 months ago
Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
Tejasvi Das, P. R. Mukund