Sciweavers

ITC
1998
IEEE
82views Hardware» more  ITC 1998»
13 years 9 months ago
A high speed and area efficient on-chip analog waveform extractor
ABSTRACT - A multiple pass A/D conversion technique is proposed for mixed-signal test applications. Only a single on-chip comparator and sample-and-hold circuit is required to digi...
Ara Hajjar, Gordon W. Roberts
ASPDAC
2004
ACM
71views Hardware» more  ASPDAC 2004»
13 years 10 months ago
Golay and wavelet error control codes in VLSI
– This paper presents a high speed VLSI implementation of wavelet and golay error control codes. The design has been fabricated by MOSIS in a TSMC 0.25 µm CMOS process. Experime...
Arunkumar Balasundaram, Angelo Pereira, Jun-Cheol ...
DATE
2005
IEEE
110views Hardware» more  DATE 2005»
13 years 10 months ago
Designer-Driven Topology Optimization for Pipelined Analog to Digital Converters
This paper suggests a practical “hybrid” synthesis methodology which integrates designer-derived analytical models for system-level description with simulation-based models at...
Yu-Tsun Chien, Dong Chen, Jea-Hong Lou, Gin-Kou Ma...
CAMP
2005
IEEE
13 years 10 months ago
Principles of a CMOS Sensor Dedicated to Face Tracking and Recognition
— This paper describes the main principles of a vision sensor dedicated to the detecting and tracking faces in video sequences. For this purpose, a current mode CMOS active senso...
Dominique Ginhac, Eri Prasetyo, Michel Paindavoine...
ISCAS
2006
IEEE
112views Hardware» more  ISCAS 2006»
13 years 11 months ago
A CMOS potentiostat for control of integrated MEMS actuators
— We describe a potentiostat designed for in situ electrochemical control of MEMS actuators. This module is tailored for integration into a hybrid CMOS-MEMS system-ona-chip to co...
S. B. Prakash, Pamela Abshire, M. Urdaneta, M. Chr...
DATE
2007
IEEE
55views Hardware» more  DATE 2007»
13 years 11 months ago
Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
Tejasvi Das, P. R. Mukund