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    2003
    IEEE
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    CMOS Built-In Test Architecture for High-Speed Jitter Measurement
    13 years 10 months ago
    CMOS Built-In Test Architecture for High-Speed Jitter Measurement
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    A BIST method measures accumulated jitter over N periods and requires no external references. Simulation using a 0.25um process shows a 625MHz - 1GHz input range with resolution o...
    Henry C. Lin, Karen Taylor, Alan Chong, Eddie Chan...
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