DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
ETS
2006
IEEE
13 years 10 months ago
2006
IEEE
In this paper, complex mixed signal circuits such as SiP or SOC including several ADCs and DACs are considered. A new DFT technique is proposed allowing the test of this complete ...
GLOBECOM
2009
IEEE
13 years 11 months ago
2009
IEEE
—In [1], we have proposed a novel cross-layer scheme based on resolution adaptive ADCs and fountain codes for the OFDM systems to lower the power consumption in ADCs. The simulat...