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DFT
2002
IEEE
103views VLSI» more  DFT 2002»
13 years 10 months ago
Duplication-Based Concurrent Error Detection in Asynchronous Circuits: Shortcomings and Remedies
Concurrent error detection (CED) methods are typically employed to provide an indication of the operational health of synchronous circuits during normal functionality. Existing CE...
Thomas Verdel, Yiorgos Makris