ASPDAC
2001
ACM
13 years 8 months ago
2001
ACM
Abstract--We present a processor-programmable built-in selftest (BIST) scheme suitable for embedded memory testing in the system-on-a-chip (SOC) environment. The proposed BIST circ...
ICCAD
1997
IEEE
13 years 9 months ago
1997
IEEE
A built-in self-test (BIST) methodology to test system backplanes by using BIST functionality in each of its constituent boards is presented. Since the configurations of systems ...