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DFT
2003
IEEE
100views VLSI» more  DFT 2003»
13 years 10 months ago
Scan-Based BIST Diagnosis Using an Embedded Processor
For system-on-chip designs that contain an embedded processor, this paper present a software based diagnosis scheme that can make use of the processor to aid in diagnosis in a sca...
Kedarnath J. Balakrishnan, Nur A. Touba