Sciweavers

ITC
1998
IEEE
61views Hardware» more  ITC 1998»
13 years 9 months ago
Test session oriented built-in self-testable data path synthesis
Existing high-level BIST synthesis methods focus on one objective, minimizing either area overhead or test time. Hence, those methods do not render exploration of large design spa...
Han Bin Kim, Takeshi Takahashi, Dong Sam Ha
ITC
1999
IEEE
107views Hardware» more  ITC 1999»
13 years 9 months ago
A high-level BIST synthesis method based on a region-wise heuristic for an integer linear programming
A high-level built-in self-test (BIST) synthesis involves several tasks such as system register assignment, interconnection assignment, and BIST register assignment. Existing high...
Han Bin Kim, Dong Sam Ha
DAC
1999
ACM
13 years 9 months ago
On ILP Formulations for Built-In Self-Testable Data Path Synthesis
In this paper, we present a new method to the built-in selftestable data path synthesis based on integer linear programming (ILP). Our method performs system register assignment, ...
Han Bin Kim, Dong Sam Ha, Takeshi Takahashi