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    DFT
    2002
    IEEE
    127views VLSI» more  DFT 2002»
    A New Functional Fault Model for FPGA Application-Oriented Testing
    13 years 9 months ago
    A New Functional Fault Model for FPGA Application-Oriented Testing
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    1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...
    Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo ...
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