ISSRE
2010
IEEE
13 years 3 months ago
2010
IEEE
Abstract—As smart phones grow in popularity, manufacturers are in a race to pack an increasingly rich set of features into these tiny devices. This brings additional complexity i...
ICST
2010
IEEE
13 years 3 months ago
2010
IEEE
—Although many static-analysis techniques have been developed for automatically detecting bugs, such as null dereferences, fewer automated approaches have been presented for anal...