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DSD
2007
IEEE
98views Hardware» more  DSD 2007»
13 years 11 months ago
Fault Diagnosis in Integrated Circuits with BIST
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evart...