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    DATE
    2000
    IEEE
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    An on Chip ADC Test Structure
    13 years 9 months ago
    An on Chip ADC Test Structure
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    In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
    Yun-Che Wen, Kuen-Jong Lee
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