Sciweavers

ISCAS
2002
IEEE
84views Hardware» more  ISCAS 2002»
13 years 9 months ago
Latchup current self-stop circuit for whole-chip latchup prevention in bulk CMOS integrated circuits
A latchup current self-stop methodology and circuit design, which are used to prevent damage in the bulk CMOS integrated circuits due to latchup, are proposed in this paper. In a ...
Jeng-Jie Peng, Ming-Dou Ker, Hsin-Chin Jiang
ISVLSI
2006
IEEE
129views VLSI» more  ISVLSI 2006»
13 years 10 months ago
Dependability Analysis of Nano-scale FinFET circuits
FinFET technology has been proposed as a promising alternative for deep sub-micro bulk CMOS technology, because of its better scalability. Previous work have studied the performan...
Feng Wang 0004, Yuan Xie, Kerry Bernstein, Yan Luo