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ATS
2003
IEEE
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13 years 10 months ago
An Enhanced Test Generator for Capacitance Induced Crosstalk Delay Faults
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer