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    IEEE
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    Expanding Trace Buffer Observation Window for In-System Silicon Debug through Selective Capture
    13 years 11 months ago
    Expanding Trace Buffer Observation Window for In-System Silicon Debug through Selective Capture
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    Trace buffers are commonly used to capture data during in-system silicon debug. This paper exploits the fact that it is not necessary to capture error-free data in the trace buffe...
    Joon-Sung Yang, Nur A. Touba
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