BSL
2007
13 years 5 months ago
2007
We present a characterization of supercompactness measures for ω1 in L(R), and of countable products of such measures, using inner models. We give two applications of this charact...
FSS
2008
13 years 5 months ago
2008
In this work we give a state-of-the-art review of two of the most established classes of fuzzy implications, viz., (S, N)- and R-implications. Firstly, we discuss their properties...
DCG
2008
13 years 5 months ago
2008
Abstract. We reformulate a known characterization of decomposability of polytopes in a way which may be more computationally convenient, and offer a more transparent proof. We appl...
DCG
2010
13 years 5 months ago
2010
The angle defect, which is the standard way to measure the curvatures at the vertices of polyhedral surfaces, goes back at least as far as Descartes. Although the angle defect has ...
AUTOMATICA
2010
13 years 5 months ago
2010
The paper presents an algebraic characterization of observability and span-reachability of bilinear hybrid systems without guards, i.e. hybrid systems whose continuous dynamics is...
NIPS
2008
13 years 6 months ago
2008
We present a characterization of a useful class of skills based on a graphical representation of an agent's interaction with its environment. Our characterization uses betwee...
AMAST
2006
Springer
13 years 8 months ago
2006
Springer
We propose two characterizations of complexity classes by means of programming languages. The first concerns Logspace while the second leads to Ptime. This latter characterization ...
LATIN
1992
Springer
13 years 9 months ago
1992
Springer
A reversible automaton is a finite (possibly incomplete) automaton in which each letter induces a partial one-to-one map from the set of states into itself. We give four non-trivi...
PPSN
1998
Springer
13 years 9 months ago
1998
Springer
The choice of the selection method used in an evolutionary algorithm may have considerable impacts on the behavior of the entire algorithm. Therefore, earlier work was devoted to t...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper argues that the existing approaches to modeling and characterization of IC malfunctions are inadequate for test and yield learning of Deep Sub-Micron (DSM) products. Tr...