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ISQED
2003
IEEE
83views Hardware» more  ISQED 2003»
13 years 10 months ago
Compact Dictionaries for Fault Diagnosis in BIST
We present a new technique for generating compact dictionaries for cause-effect diagnosis in BIST. This approach relies on the use of three compact dictionaries: (i) D1, containin...
Chunsheng Liu, Krishnendu Chakrabarty