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16
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VLSID
2010
IEEE
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VLSI
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VLSID 2010
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Synchronized Generation of Directed Tests Using Satisfiability Solving
13 years 2 months ago
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www.cise.ufl.edu
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
Xiaoke Qin, Mingsong Chen, Prabhat Mishra
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