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ITC
2002
IEEE
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13 years 9 months ago
Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
David B. Lavo, Ismed Hartanto, Tracy Larrabee