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ASAP
2008
IEEE
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ASAP 2008
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Managing multi-core soft-error reliability through utility-driven cross domain optimization
13 years 11 months ago
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www.ideal.ece.ufl.edu
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
Wangyuan Zhang, Tao Li
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