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    ITC
    1997
    IEEE
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    Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data
    13 years 9 months ago
    Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data
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    Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points and on IDD switching transients on the sup...
    James F. Plusquellic, Donald M. Chiarulli, Steven ...
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