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ISQED
2007
IEEE
182views Hardware» more  ISQED 2007»
13 years 11 months ago
Defect or Variation? Characterizing Standard Cell Behavior at 90nm and below
Historically, design margin and defects have been viewed as different topics, one part of design and the other part of test. Shrinking process geometries are making the two part o...
Robert C. Aitken