ISCAS
2003
IEEE
13 years 10 months ago
2003
IEEE
A deterministic dynamic element matching (DEM) approach to ADC testing is introduced and compared with a common random DEM method. With both approaches, a highly non-ideal DAC is ...
ISCAS
2005
IEEE
13 years 10 months ago
2005
IEEE
This work presents a cost-effective test structure that is applicable to built-in self-test of time-to-digital converters (TDCs). The proposed structure uses deterministic dynamic ...