DFT
1998
IEEE
13 years 9 months ago
1998
IEEE
DFT
1998
IEEE
13 years 9 months ago
1998
IEEE
DFT
1998
IEEE
13 years 9 months ago
1998
IEEE
We present the results of hardware experiments designed to determine the relative contribution of CMOS coupling mechanisms to off-path signal variations caused by common types of ...
DFT
1998
IEEE
13 years 9 months ago
1998
IEEE
The statistical variations in electrical parameters, such as transistor gain factors and interconnect resistances, due to variations in the manufacturing process are studied using...
DFT
1998
IEEE
13 years 9 months ago
1998
IEEE
In the presence of multiple delay faults, automated diagnostic procedures that make a single fault assumption may give an incorrect diagnosis. In this paper, a systematic approach...
DFT
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a system to evaluate the testability of an on-line testable circuit. The system operates at the RT-level, before the logic synthesis step, and allows for an ex...
DFT
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper describes a system suited to support the Fault Injection process for microprocessor-based embedded systems. The system exploits a low-cost hardware board to monitor the...