DFT
1999
IEEE
13 years 8 months ago
1999
IEEE
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
DFT
1999
IEEE
13 years 8 months ago
1999
IEEE
Integrated Circuit manufacturing complexities have resulted in decreasing product yields and reliabilities. This process has been accelerated with the advent of very deep sub-micr...
DFT
1999
IEEE
13 years 8 months ago
1999
IEEE
A programmable single-chip multiprocessor system for video coding has been developed. The system is implemented in a high-performance 0.25 m logic/embedded DRAM process. It integr...
DFT
1999
IEEE
13 years 8 months ago
1999
IEEE
The paper describes a systematic approach for automatically introducing data and code redundancy into an existing program written using a high-level language. The transformations ...
DFT
1999
IEEE
13 years 8 months ago
1999
IEEE
This paper describes the yield estimation approach to layout scaling of submicron VLSI circuits. The presented method makes it feasible to find scaling factor of the IC design whi...
DFT
1999
IEEE
13 years 8 months ago
1999
IEEE
Fault identification capabilities are becoming increasingly important in modern designs, not only in support of design debugging methodologies, but also for the purpose of process...
DFT
1999
IEEE
13 years 8 months ago
1999
IEEE
The inherent redundancy and in-the-field reconfiguration capabilities of field programmable gate arrays (FPGAs) provide alternatives to integrated circuit redundancy-based fault r...
DFT
1999
IEEE
13 years 8 months ago
1999
IEEE
In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode, while power consumption durin...